Construction of “High-performance Chip Test Platform” Has Made Phased Progress!
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2024-06-12
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Phased progress has been made in the construction of the “High-performance Chip Test Platform”, which is operated by Beijing Zhongfa Chip Test Technology Co. Ltd. (referred to as “Zhongfa Chip Test”).
As of the end of this May, the first batch of over 110 units/sets of equipment, including network analyzer, vector analyzer, high-speed oscilloscope, phase noise meter, and etc., has passed the acceptance and been applied to related chip R&D efforts by major customers. The platform can meet the test needs of RF, network, signal and all other functions, marking its first landing of services.
Zhongfa Chip Test, founded in January 2024, has a professional team who delve into IC technology. The High-performance Chip Test Platform consists of “Chip Analysis and Simulation Platform”, “CP/FT Test Platform” and “Chip School”, covering design verification of chip products, sample and wafer testing, application testing and other life-cycle key test and verification, as well as talent training services.
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